Measuring Students’ Level of Interest in Learning Embedded Systems Course: Instrument Development and Validation using Rasch Analysis
DOI:
https://doi.org/10.58915/jere.v18.2026.3007Keywords:
Embedded system, Rasch, reliability, validity, InterestAbstract
Increasingly essential to several industries, including consumer electronics, medicine, and automobiles, are embedded systems. But students are frequently frightened by their complexity, which presents difficulties in schooling. This research solves these problems by using Rasch analysis to create and check a scale gauging students' interest in Embedded Systems Design courses. Following content validation by an expert panel, a theoretical framework for the scale was created using a thorough literature analysis. In a pilot study with 40 people, the dependability of the scale was assessed. A bigger survey including 365 students from several colleges produced a diverse sample for study using WINSTEPS 5.7.4 to evaluate the dimensionality of the scale items, which resulted in high reliability scores (0.70 for people and 0.97 for items). The results, nevertheless, showed an alarming pattern: embedded systems design attracted little interest from students, which may impede academic performance and knowledge. This absence of involvement emphasizes the pressing need for educational institutions to update their curricula and teaching methods to stimulate more interest and provide students with vital abilities for technology-driven labor. Overall, the research offers helpful tips for measuring interest in embedded systems of education and emphasizes the importance of addressing these challenges.
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