Lee Boon Thuan, M.K. Md Arshad, W.M.W Norhaimi. Evaluate the impact of advanced cell pitch on U-MOSFET wafer edge IGSS failure in a CMOS environment. IJNeaM [Internet]. 2026 Apr. 10 [cited 2026 Jun. 13];19(2):289-97. Available from: https://ejournal.unimap.edu.my/index.php/ijneam/article/view/3107