A.H Afifah Maheran, M. Pritigavane, N.H.N.M. Nizam, F. Salehuddin, and N. Sabani, “Taguchi Method Statistical Analysis on Characterization and Optimization of 18-nm Double Gate MOSFETs”, IJNeaM, vol. 17, no. 4, pp. 549–555, Oct. 2024.