K.Y Koay, M.F.M Fathil, M. Nuzaihan, R. M Ayub and M.K. Md Arshad (2024) “Numerical Simulation on the Impact of Back Gate Voltage in Thin Body and Thin Buried Oxide of Silicon on Insulator (SOI) MOSFETs”, International Journal of Nanoelectronics and Materials (IJNeaM) , 16(4), pp. 819–826. doi: 10.58915/ijneam.v16i3.1349.