Nilaventhiran Vespanathan, Noraini Othman, S. N. Sabki, and Alhan Farhanah Abd Rahim. 2023. “Impact of Nanowire Radius and Channel Thickness With High-K Gate Dielectric in GAA-JLT”. International Journal of Nanoelectronics and Materials (IJNeaM) 16 (December):317-22. https://doi.org/10.58915/ijneam.v16iDECEMBER.413.