SUAD M.KADHIM. Characterization of Nanocrystalline SnS Thin Film Fabricated used PLD Method for Photodetection Applications. International Journal of Nanoelectronics and Materials (IJNeaM) , [S. l.], v. 17, n. 2, p. 172–179, 2024. DOI: 10.58915/ijneam.v17i2.656. Disponível em: https://ejournal.unimap.edu.my/index.php/ijneam/article/view/656. Acesso em: 20 may. 2024.