ROER EKA PAWINANTO; MUHAMMAD REVA FERDIANSYAH; MUHAMMAD ADLI RIZQULLOH; WIRA HADI KUSUMA; JAHRIL NUR FAUZAN; RESA PRAMUDITA; ERIK HARITMAN; IBNU HARTOPO; BUDI MULYANTI. Characteristics prediction of sub-5 nm nanosheet field effect transistor (FET) using a machine learning approach. International Journal of Nanoelectronics and Materials (IJNeaM) , [S. l.], v. 19, n. 2, p. 269–275, 2026. Disponível em: https://ejournal.unimap.edu.my/index.php/ijneam/article/view/3105. Acesso em: 9 apr. 2026.