PHEY YEE FOONG; NURHANANI ZAKARIA; THENG THENG TAN; ZHI EN ER; CHAOWEI DU. Unintended Catalysis and Defect Formation in Electroless Metallization of Semiconductor Wafers. International Journal of Nanoelectronics and Materials (IJNeaM) , [S. l.], v. 18, n. December, p. 151–159, 2025. DOI: 10.58915/ijneam.v18iDecember.2823. Disponível em: https://ejournal.unimap.edu.my/index.php/ijneam/article/view/2823. Acesso em: 31 dec. 2025.