M. HAZEEM HARIFF; NORAINI OTHMAN; S. N. SABKI; ALHAN FARHANAH ABD RAHIM. Performance Analysis of JL-FinFET with Varied Non-Uniform Doping Concentrations, Fin Height and Fin Width using Device Simulator. International Journal of Nanoelectronics and Materials (IJNeaM) , [S. l.], v. 16, n. 1, p. 187–194, 2024. DOI: 10.58915/ijneam.v16i1.1216. Disponível em: https://ejournal.unimap.edu.my/index.php/ijneam/article/view/1216. Acesso em: 22 nov. 2024.