SONI, S. K.; SINGH, R. S.; SONI, P. Characterization and properties of NiO-ZnO nanocrystalline thin films on glass substrates deposited by SILAR technique . International Journal of Nanoelectronics and Materials (IJNeaM) , [S. l.], v. 18, n. 3, p. 423–432, 2025. DOI: 10.58915/ijneam.v18i3.1207. Disponível em: https://ejournal.unimap.edu.my/index.php/ijneam/article/view/1207. Acesso em: 13 aug. 2025.