Sh. M. Eladl and K. A. Sharshar 2024. Experimental Performance Analysis of Fabricated Si/Ge Thin Film Structure. International Journal of Nanoelectronics and Materials (IJNeaM) . 16, 1 (Oct. 2024), 53–61. DOI:https://doi.org/10.58915/ijneam.v16i1.925.