A.H Afifah Maheran, M. Pritigavane, N.H.N.M. Nizam, F. Salehuddin and N. Sabani 2024. Taguchi Method Statistical Analysis on Characterization and Optimization of 18-nm Double Gate MOSFETs. International Journal of Nanoelectronics and Materials (IJNeaM) . 17, 4 (Oct. 2024), 549–555. DOI:https://doi.org/10.58915/ijneam.v17i4.1282.