[1]
M. Hazeem Hariff, Noraini Othman, S. N. Sabki and Alhan Farhanah Abd Rahim 2024. Performance Analysis of JL-FinFET with Varied Non-Uniform Doping Concentrations, Fin Height and Fin Width using Device Simulator. International Journal of Nanoelectronics and Materials (IJNeaM) . 16, 1 (Oct. 2024), 187–194. DOI:https://doi.org/10.58915/ijneam.v16i1.1216.